新しいドライブを取得しましたが、smartctl
が不良セクターを検出したかどうか混乱しています。ショートセルフテストと拡張セルフテストの両方completed without error
。ただし、Error Log
は、Uncorrectable error in data
の96 sectors
を示します。
smartctl
の出力は次のとおりです。
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-52-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar T7K500
Device Model: Hitachi HDT725025VLA380
Serial Number: VFL104R73X993Z
LU WWN Device Id: 5 000cca 316f723ca
Firmware Version: V5DOA73A
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Wed Feb 5 19:19:29 2014 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4949) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 83) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 110 110 024 Pre-fail Always - 338 (Average 340)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 1838
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 11746
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1822
192 Power-Off_Retract_Count 0x0032 099 099 000 Old_age Always - 2103
193 Load_Cycle_Count 0x0012 099 099 000 Old_age Always - 2103
194 Temperature_Celsius 0x0002 162 162 000 Old_age Always - 37 (Min/Max 12/48)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 27 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 27 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:28:22.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:22.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:28:22.200 SET FEATURES [Set transfer mode]
Error 26 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:28:11.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:11.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:28:11.200 SET FEATURES [Set transfer mode]
Error 25 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:28:00.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:28:00.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:28:00.200 SET FEATURES [Set transfer mode]
Error 24 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:27:49.700 READ DMA EXT
25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT
25 03 01 00 00 00 40 00 02:27:49.200 READ DMA EXT
ef 03 46 c4 33 e7 00 00 02:27:49.200 SET FEATURES [Set transfer mode]
Error 23 occurred at disk power-on lifetime: 11706 hours (487 days + 18 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 60 e4 33 e7 47 Error: UNC 96 sectors at LBA = 0x07e733e4 = 132592612
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 80 c4 33 e7 40 00 02:27:38.900 READ DMA EXT
25 03 08 7c a8 3a 40 00 02:27:38.900 READ DMA EXT
35 03 08 7c a8 3a 40 00 02:27:38.900 WRITE DMA EXT
25 03 08 7c a8 3a 40 00 02:27:38.900 READ DMA EXT
25 03 08 a4 eb 94 40 00 02:27:38.900 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 11746 -
# 2 Short offline Completed without error 00% 11744 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
そして、これがError Log
のスクリーンショットです。
何が起こっているのでしょうか?ドライブに不良セクターがあるかどうか。
UPDATE1:
How do you use badblocks? で提案されているように、badblocks
も使用したことを確認します。
まず、非破壊的な1時間の読み取り専用メソッド:
root@xubuntu:/home/xubuntu# badblocks -sv /dev/sda
Checking blocks 0 to 244198583
Checking for bad blocks (read-only test): done
Pass completed, 0 bad blocks found. (0/0/0 errors)
そして、破壊的な10時間の書き込みメソッド(注意して使用してください):
root@xubuntu:/home/xubuntu# badblocks -wsv /dev/sda
Checking for bad blocks in read-write mode
From block 0 to 244198583
Testing with pattern 0xaa: done
Reading and comparing: done
Testing with pattern 0x55: done
Reading and comparing: done
Testing with pattern 0xff: done
Reading and comparing: done
Testing with pattern 0x00: done
Reading and comparing: done
Pass completed, 0 bad blocks found. (0/0/0 errors)
回答で示唆されているように、このハードドライブには不良セクターがあるようには見えません。 (わーい!)
ディスクの表面からのデータの読み取りに問題がありましたが、ディスクがそれを処理したようです。私は同様の状況にありました:
Error 29 occurred at disk power-on lifetime: 18836 hours (784 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 00 40 37 e6 Error: UNC 8 sectors at LBA = 0x06374000 = 104284160
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 00 40 37 e6 08 03:39:32.447 READ DMA
c8 00 08 f8 3f 37 e6 08 03:39:32.447 READ DMA
c8 00 08 f0 3f 37 e6 08 03:39:32.447 READ DMA
c8 00 08 e8 3f 37 e6 08 03:39:32.447 READ DMA
c8 00 08 e0 3f 37 e6 08 03:39:32.447 READ DMA
そして、私がテストを実行したいとき、私は得ました:
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 7 Short offline Completed: read failure 90% 18845 104284160
最終的に、セクターのブロックを解除し、表面全体をスキャンする拡張テストを実行した後、次の結果が得られました。
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 3 Extended offline Completed without error 00% 18858 -
不良ブロックがあった場合、以下の表で確認できます。
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
あなたの場合、最後のエラーが発生した後(11706時間)に拡張テストが実行された(11746時間)ため、不良セクターの兆候はありません。だから、安らかに眠ることができます。 :)
コメントで述べたように、不良ブロックには2つのタイプがあります。この2つの違いについて簡単に説明します。
不良セクターには2つのタイプがあります。多くの場合、「物理」不良セクターと「論理」不良セクター、または「ハード」不良と「ソフト」不良セクターに分けられます。
物理的な(またはハードな)不良セクターは、物理的に損傷したハードドライブ上のストレージのクラスターです。ハードドライブのヘッドがハードドライブのその部分に触れて損傷した可能性があります。一部のほこりがそのセクターに落ち着いて破損した可能性があります、ソリッドステートドライブのフラッシュメモリセルが摩耗した、またはハードドライブに他のものがあった可能性がありますセクターが物理的に損傷する原因となった欠陥または摩耗の問題。このタイプのセクターは修復できません。
論理的またはソフトな不良セクターは、ハードドライブ上のストレージのクラスターであり、正常に動作していないようです。オペレーティングシステムがこのセクターからハードドライブ上のデータを読み取ろうとしたときに、エラー修正コード(ECC)がセクターの内容と一致していないことがわかりました。これは、何か問題があることを示しています。これらは不良セクターとしてマークされている可能性がありますが、ドライブをゼロで上書きするか、昔は低レベルのフォーマットを実行することで修復できます。 Windowsのディスクチェックツールは、このような不良セクターを修復することもできます。