この種のエラーが発生するのは、これが初めてではありません。ファイルのアクセス許可がread-only
になったときにコンピューター(Ubuntu 3.2)を使用していたため、コンピューターを再起動しましたが、電源が入っていなかったため、強制的にオフ(ハード電源オフ)にしました。再びそれをオンにしていました、そして私はこれを見ました:
/dev/sda2 contains a file system with errors, check forced.
Inodes that were part of a corrupted Orphan linked list found.
/dev/sda2: UNEXPECTED INCOSISTENCY; RUN fsck MANUALLY.
(i.e., without -a or -p options)
fsck exited with status code 4
The root filesystem on /dev/sda2 requires a manual fsck
BusyBox v1.27.2 (Ubuntu 1:1.27.2-2ubuntu3.2) built-in Shell (ash)
Enter 'help' for a list of built-in commands.
(initramfs)
私はfsck /dev/sda2
を書いた(-a
は、それがないとどうすればいいのかわからないので)と書いたが、これは初めてではないので心配だ。おそらく、ハードディスクが壊れているか、または知っている。多分これは私の問題に最適な場所ではありません。何をすべきか教えてくれませんか?次は何ですか?学びたいので、あなたの提案はあまりにも役に立ちます。
P.D .:私の英語でごめんなさい
私はfsck /dev/sda2
を書きました、そして次は:
fsck from util-linux 2.31.1
e2fsck 1.44.1 (24-Mar-2018)
/dev/sda2 contains a file system with errors, check forced.
Pass 1: Checking inodes, blocks, and sizes
Inodes that were of a corrupted Orphan linked list found. Fix<y>?
y
を入力すると、画面が表示されます。
Inode 18874440 was part of the orphaned inode list. FIXED
Inode 18874445 was part of the orphaned inode list. FIXED
Inode 18874466 was part of the orphaned inode list. FIXED
そしてその20行、以下は
Pass 2: Checking directory structure
Pass 3: Checking directory connectivity
Pass 4: Checking reference counts
Pass 5: Checking group summary information
Block bitmap differences: -(2494976--2495023) - (so many numbers)....
Fix<y>? yes
Free blocks count wrong for group #76 (19099, counted 19147).
Fix<y>? yes
Free blocks count wrong for group #81 (30339, counted=30365)
Fix<y>? yes
Free blocks count wrong for group #1577 (28430, counted=28437)
Fix<y>? yes
...
最後に
/dev/sda2: ***** FILE SYSTEM WAS MODIFIED *****
/dev/sda2: 541701/61022208 files (0.4% non-contiguous), 18674207/244059136 blocks
この後、私はreboot
と書いたところ、コンピューターが動作するようになりました。しかし、これは再び起こり、私はそれを止める必要があります。
これを調査するためにいくつかの本が必要です、なぜこれが起こるのか知りたいです。
pdate: Mozilla Firefoxを使用していたときに再び発生し、ファイルの権限がread only
に変わりました。その後、PCを再起動しましたが、完了しません。再起動してfsck
を再度使用する必要があります。
Sudo smartctl -a /dev/sda
の出力:
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-5.3.0-42-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Toshiba MQ04ABF100
Serial Number: X8JBP3K2T
LU WWN Device Id: 5 000039 8d268714d
Firmware Version: JU001J
User Capacity: 1.000.204.886.016 bytes [1,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Mar 29 03:48:34 2020 -03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 172) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1348
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 596
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 095 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 1544
10 Spin_Retry_Count 0x0033 111 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 421
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 1265
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 20
193 Load_Cycle_Count 0x0032 096 096 000 Old_age Always - 48581
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 35 (Min/Max 13/45)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 253 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0
222 Loaded_Hours 0x0032 097 097 000 Old_age Always - 1346
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 260
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 1096 hours (45 days + 16 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 31 00 02 59 d7 a9
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ea 00 00 00 00 00 a0 00 05:01:42.830 FLUSH CACHE EXT
61 58 30 38 f9 20 40 00 05:01:42.830 WRITE FPDMA QUEUED
61 08 80 08 f9 1b 40 00 05:01:42.829 WRITE FPDMA QUEUED
61 08 78 a0 b8 52 40 00 05:01:42.788 WRITE FPDMA QUEUED
61 30 70 58 0c 50 40 00 05:01:42.788 WRITE FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
私のアドバイス:データを今すぐバックアップして、できるだけ早くドライブを交換してください。 Linuxを実行していた古いMacbookで数年前に同様の問題が発生しました。ルートファイルシステムが突然読み取り専用になり、再起動時に毎回fsck
を実行して修正する必要がありました。 smartmontools
は、すべて問題がないことを示しています。ハードディスクを交換したところ、問題はすぐに解消しました。
あなたの問題が必ずしも同じであるとは言っていませんが、私が経験したものと非常によく似ています。念のため、少なくともデータは必ずバックアップしてください。