私は実行していますsmartctl -t long
ドライブで約2日間、10%で停止しているようです。ショートと運搬の両方が通過しました。購入した2台のドライブのうち1台を返送する必要があります。不良ブロックのある不良ブロックが見つかりました(このドライブには何もありません。すでにパスを通過していません)。私はこれについて心配する必要があるかどうか疑問に思っています。
smartctl 5.39.1 2010-01-28 r3054 [x86_64-unknown-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: WDC WD10EARS-00Y5B1
Serial Number: WD-WMAV51582123
Firmware Version: 80.00A80
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Mon May 10 22:19:52 2010 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 241) Self-test routine in progress...
10% of test remaining.
Total time to complete Offline
data collection: (20100) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 231) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3031) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 2
3 Spin_Up_Time 0x0027 131 131 021 Pre-fail Always - 6408
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 12
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 148
10 Spin_Retry_Count 0x0032 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 10
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 7
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 174
194 Temperature_Celsius 0x0022 106 102 000 Old_age Always - 41
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Conveyance offline Completed without error 00% 99 -
# 2 Extended offline Interrupted (Host reset) 10% 30 -
# 3 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
完了したようです...smartctl -t long
の実行中にbadblockを実行すると、Aが終了しないか、Bに時間がかかると思います。