RHELにソフトウェアRAID 1アレイがあります。このエラーが毎朝メールで送られてきます:デバイス:/ dev/sda [SAT]、1現在、読み取り不能(保留中)のセクター
Sda(またはsdb)でテストを実行すると、すべてが合格したように見えます。何か不足していますか?
mdstatはRAIDアレイに問題がないことを示しています。
# cat /proc/mdstat
Personalities : [raid1]
md5 : active raid1 sdb5[1] sda5[0]
108026816 blocks [2/2] [UU]
md1 : active raid1 sdb1[1] sda1[0]
511936 blocks [2/2] [UU]
md2 : active raid1 sda2[0] sdb2[1]
805306304 blocks [2/2] [UU]
md3 : active raid1 sda3[0] sdb3[1]
62914496 blocks [2/2] [UU]
unused devices: <none>
次に出力を示します。#smartctl -q noserial -a/dev/sda
私も実行してみました:#smartctl -t long/dev/sda
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-2.6.32-279.9.1.el6.x86_64] (local build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Ultrastar A7K1000
Device Model: Hitachi HUA721010KLA330
Firmware Version: GKAOAB0A
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Sun May 21 17:51:42 2017 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from Host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (15354) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 098 098 016 Pre-fail Always - 4
2 Throughput_Performance 0x0005 100 100 054 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 122 122 024 Pre-fail Always - 550 (Average 591)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 68
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 094 094 000 Old_age Always - 43202
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 68
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 751
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 751
194 Temperature_Celsius 0x0002 090 090 000 Old_age Always - 66 (Min/Max 17/72)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 43186 -
# 2 Extended offline Completed without error 00% 43170 -
# 3 Short offline Completed without error 00% 43162 -
# 4 Short offline Completed without error 00% 43138 -
# 5 Short offline Completed without error 00% 43114 -
# 6 Short offline Completed without error 00% 43090 -
# 7 Short offline Completed without error 00% 43066 -
# 8 Short offline Completed without error 00% 43042 -
# 9 Extended offline Completed without error 00% 43031 -
#10 Short offline Completed without error 00% 43024 -
#11 Short offline Completed without error 00% 43018 -
#12 Extended offline Completed without error 00% 43002 -
#13 Short offline Completed without error 00% 42994 -
#14 Short offline Completed without error 00% 42970 -
#15 Short offline Completed without error 00% 42946 -
#16 Short offline Completed without error 00% 42922 -
#17 Short offline Completed without error 00% 42898 -
#18 Short offline Completed without error 00% 42874 -
#19 Short offline Completed without error 00% 42850 -
#20 Extended offline Completed without error 00% 42833 -
#21 Short offline Completed without error 00% 42826 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
あなたのSMART現在の保留セクターの値は1です。これは、ディスクに不良セクターがあり、ドライブファームウェアがそれを再割り当てできないが、再割り当てセクター数がゼロであるため、おそらくドライブが非常に健康でない環境で5年間稼働している場合でも回復可能-温度は最大72 C°です。
dd if=/dev/sda of=/dev/null
を使用してこの不良セクターを見つけてから、上書きしてセクターを再マッピングする必要があります。